Join our mailing list!

Official PayPal Seal

(Your shopping cart is empty)

  Home > Diane Publishing Books >

Accuracy Barriers of Quantitative Electron Beam X-Ray Microanalysis
Accuracy Barriers of Quantitative Electron Beam X-Ray Microanalysis
Our Price: $45.00
Year: 2002
Pages: 245
Binding Paperback

Product Code: 0756735297

Theodore V. Vorburger, Dale E. Newbury, & Ryna B. Marinenko (ed). A Special Issue of the Journal of Research of the Nat. Institute of Standards & Technology (NIST). Electron probe x-ray microanalysis (EPMA) is one of the oldest yet still one of the most widely applied methods of spatially-resolved elemental analysis. Leading experts in EPMA from industry, academia, & government, from the U.S., Canada, Mexico, & Europe met at NIST, April 8-11, 2002, to participate in a workshop on “The Accuracy Barrier in Quantitative EPMA & the Role of Standards,” Co-sponsored by the Surface & Microanalysis Science Div. of the Chemical Science & Technology Lab. & the Microbeam Analysis Soc. (U.S.). This illustrated volume contains 19 papers from that workshop.

Share your knowledge of this product with other customers... Be the first to write a review
Diane Publishing Co
PO Box 617
Darby, PA 19023-0617
 About Us
 Become an Affiliate
 Privacy Policy
 Send Us Feedback
Company Info | Advertising | Product Index | Category Index | Help | Terms of Use
Copyright � 2004 Diane Publishing Company. All Rights Reserved.
Built with Volusion