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Metrology for Radio-Frequency Technology: A Bibliography
Metrology for Radio-Frequency Technology: A Bibliography
Our Price: $25.00
Year: 1999
Pages: 145
Binding Paperback

Product Code: 0756706157

Ruth Marie Lyons (ed). Lists the publications by the staff of the Radio-Frequency Tech. Div. (RFTD) of NIST for the period Jan. 1970 through July 1999. Selected earlier publications from the Divisionís predecessor org. are included. Programs of the RFTD include metrology for the fundamental microwave quantities such as power, noise, impedance, & scattering parameters; standards & metrology for wireless systems; gain, pattern, & polarization measurements for antennas; electromagnetic properties of materials; measurements for high speed microelectronics; electromagnetic field characterization & electromagnetic compatibility.

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