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Diane Publishing Books
Critical Issues in Scanning Electron Microscope (SEM) Metrology
Michael T. Postek. Optical microscopy, scanning electron microscopy & the various forms of scanning probe microscopies are major microscopical techniques used to make measurements during the manufacture of integrated circuits. This report reviews the current state of SEM metrology in light of the many recent improvements. Charts & tables.
Karluk: The Great Untold Story of Arctic Exploration
In the Combat Zone: Special Forces Since 1945
Not Fade Away: The On-Line World Remembers Jerry Garcia
History of the New York Central System
Wordsworth Dictionary of the American West
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