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  Home > Diane Publishing Books >

Optical Characterization in Microelectronics Manufacturing
Optical Characterization in Microelectronics Manufacturing
 
Our Price: $25.00
Year: 1994
Pages: 34
Binding Paperback

Product Code: 0788115391

Description
 
S. Perkowitz & D.G. Seiler. Covers ellipsometry, infrared spectroscopy, optical microscopy, modulation spectroscopy, photoluminescence & raman scattering.  Bibliography.

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