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Accuracy Barriers of Quantitative Electron Beam X-Ray Microanalysis
Accuracy Barriers of Quantitative Electron Beam X-Ray Microanalysis
 
Our Price: $45.00
Year: 2002
Pages: 245
Binding Paperback

Product Code: 0756735297

Description
 
Theodore V. Vorburger, Dale E. Newbury, & Ryna B. Marinenko (ed). A Special Issue of the Journal of Research of the Nat. Institute of Standards & Technology (NIST). Electron probe x-ray microanalysis (EPMA) is one of the oldest yet still one of the most widely applied methods of spatially-resolved elemental analysis. Leading experts in EPMA from industry, academia, & government, from the U.S., Canada, Mexico, & Europe met at NIST, April 8-11, 2002, to participate in a workshop on “The Accuracy Barrier in Quantitative EPMA & the Role of Standards,” Co-sponsored by the Surface & Microanalysis Science Div. of the Chemical Science & Technology Lab. & the Microbeam Analysis Soc. (U.S.). This illustrated volume contains 19 papers from that workshop.

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